Zhang, Y. ., Li, Y. ., Chen, X. ., Yang, J. ., Hua, Y. ., & Yao, J. . (2022). PUF-based Secure Test Wrapper Design for Network-on-Chip. In (pp. 181–184). McLean, VA, USA: IEEE. http://doi.org/10.1109/HOST54066.2022.9840115 (Original work published 2024)