Advancing DoD’s Ability to Test Critical Microelectronics

Under the auspices of DARPA’s Integrity and Reliability of Integrated Circuits program, researchers from the Naval Surface Warfare Center (NSWC) and Air Force Research Laboratory (AFRL) are developing advanced failure analysis techniques to assess the reliability and integrity of microchips embedded in the some of the nation’s most critical military weapon and cyber systems.  This work will provide powerful new tools to verify whether chips produced in commercial facilities around the world have been compromised at any stage of their design and fabrication.

*more: http://science.dodlive.mil/2015/01/09/advancing-dods-ability-to-test-critical-microelectronics/