"Mathematicians Prove That Flash-Memory 'Fingerprints' of Electronic Devices Are Truly Unique"
Mathematicians at RUDN University have proven that the defects in flash memory cells can be used as fingerprints for memory chips. This method will strengthen the security of electronic devices against hacks. The growth of devices such as smartphones, fitness bracelets, and memory devices continues to raise concerns about the theft and unauthorized alteration of these devices. Devices can be identified through the use of virtual or physical methods in which unique numbers are hard written into devices and fluctuations of a device's radio frequency act as the identifiers. However, these methods are still subject to tampering in that software can be hacked and interference with radio signals can occur. The new method of physical identification involves the use of microscopic manufacturing defects that result in damaged flash memory cells. As patterns of microdefects are truly unique, they can be used to distinguish one device from another. This article continues to discuss existing device identification methods, the new method of physical identification based on damaged flash memory cells, and how experts from RUDN University verified the effectiveness of this method.